Paper Title :The use of Focused Electron and Ion Beams for The Functionalization and Nanostructuring of Polymer Surfaces
Author :Meltem Sezen, Feray Bakan
Article Citation :Meltem Sezen ,Feray Bakan ,
(2017 ) " The use of Focused Electron and Ion Beams for The Functionalization and Nanostructuring of Polymer Surfaces " ,
International Journal of Advances in Science, Engineering and Technology(IJASEAT) ,
pp. 14-18,
Volume-5, Issue-2, Spl. Iss-1
Abstract : Polymers are nowadays actively used in numerous applications owing their low cost and optimized structural
properties. Besides, the miniaturization of the novel materials down to nano and even atomic scale needs the use of Electron
Microscopy techniques both for imaging and structuring abilities. When used for surface modification, electrons and ions
allow altering the surface properties towards special material designs. This study mainly focuses on investigation,
optimization and modification of polymers’ surface properties by the use of electron and ion beam treatment assisted by gas
enhanced etching processes in FIB-SEM dual-beam platforms. Direct electron/ion beam etching and XeF 2 assisted etching
were applied on high density polyethylene (HDPE), Melinex ® and polypropylene (PP) samples, in order to obtain different
forms of functionalized surfaces. The alterations in the surface properties provided by electron/ion beam and gas assisted
modification processes were examined using complementary advanced analysis techniques, such as HR-SEM and AFM.
Keywords- Focused Ion Beams, Nanostructuring, Polymers, Functionalization, Electron Microscopy, Surface Modification
Type : Research paper
Published : Volume-5, Issue-2, Spl. Iss-1
DOIONLINE NO - IJASEAT-IRAJ-DOIONLINE-7981
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Published on 2017-07-08 |
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