FPGA Based Digital IC Tester
This paper describes the implementation of testing of CMOS digital integrated circuits for both functional and
delay fault testing using reconfigurable field programmable gate array, XC3S500E. This FPGA is interfaced with LCD and
hex keypad, has created a very comfortable environment for CMOS digital integrated circuits testing. Tester has generated
and applied test vectors for functional and delay fault testing for particular CMOS ICs and check responses with according to
particular Gate response. After that, it can declare that CMOS ICs have any functional and delay fault or not. This
reconfigurable FPGA based digital IC tester has many advantages over conventional IC testing using automatic test
Keywords— DUT, FPGA, ATEs.