Design Of An Automated Reflection Ellipsometry Setup For Determining Complex Permittivity Of Materials In Microwave Band
This paper deals with an automated setup dedicated for characterization of dielectric properties of materials at
microwave frequencies based on the reflection Ellipsometry technique. This instrumentation presents itself as an alternate
and inexpensive choice to a vector network analyser. The complex permittivity of a soda lime glass sheet was measured.
Interfaces involved in the automation of the Ellipsometry setup are briefly discussed. The numerical approach for determining
the complex permittivity is also discussed.