International Journal of Electrical, Electronics and Data Communication (IJEEDC)
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Statistics report
Apr. 2024
Submitted Papers : 80
Accepted Papers : 10
Rejected Papers : 70
Acc. Perc : 12%
Issue Published : 133
Paper Published : 1712
No. of Authors : 4737
  Journal Paper


Paper Title :
Fault Tolerance Improvement of The Secured Circuits

Author :Ghania Ait Abdelmalek, Rezki Ziani, Rabah Mokdad

Article Citation :Ghania Ait Abdelmalek ,Rezki Ziani ,Rabah Mokdad , (2018 ) " Fault Tolerance Improvement of The Secured Circuits " , International Journal of Electrical, Electronics and Data Communication (IJEEDC) , pp. 50-52, Volume-6,Issue-9

Abstract : One of the major problems in testing a system-on-chip is dealing with the optimal choice of the test sequence. In this paper, we propose an efficient test sequence for TMR secure circuits. The test sequence is a high level method based on three pulsations. An extension to the sequence with one pulsation is proposed and by simulation results its effectiveness in achieving a higher fault tolerance interval is demonstrated.

Type : Research paper

Published : Volume-6,Issue-9


DOIONLINE NO - IJEEDC-IRAJ-DOIONLINE-13702   View Here

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